Overview
Mikrometry Leeb Hardness Impact Devices for adapt compatible hardness testers to specimen size, access and surface condition.
Key Features
- Interchangeable Leeb impact devices
Applications
Select the impact device to suit the measurement location, specimen geometry and hardness-test application. The range includes configurations for general use and restricted access. Confirm that the host instrument supports the chosen device and apply the corresponding material and test settings.
- Adapt compatible hardness testers to specimen size, access and surface condition
Specifications
| Technical specification |
|---|
| D / DC / DL / D+15: 11 mJ |
| C: 2.7 mJ |
| G: 90 mJ |
Models and Options
| SKU | Model / configuration |
|---|---|
| ITS-MIK-IMPACT-D | D – general purpose |
| ITS-MIK-IMPACT-DC | DC – confined access |
| ITS-MIK-IMPACT-DL | DL – grooves and narrow access |
| ITS-MIK-IMPACT-D15 | D+15 – recessed surfaces |
| ITS-MIK-IMPACT-C | C – lower impact energy |
| ITS-MIK-IMPACT-G | G – large components |
Included and Optional Accessories
Compatible Mikrometry Leeb hardness tester. Confirm the selected package; optional equipment is quoted separately.