Mikrometry EHL interchangeable impact devices extend the application range of compatible Leeb hardness testers. Select the device that matches the component geometry, surface access and test requirement.
Model specifications
| Device | Configuration and use |
|---|---|
| D | General-purpose standard impact device |
| DC | Short body for confined spaces |
| DL | Slim probe for narrow grooves and restricted areas |
| D+15 | Extended front section for recessed surfaces |
| C | Reduced impact energy for smaller, lighter or surface-hardened components |
| G | Higher impact energy for heavy, coarse-grained cast and forged parts |
Applications
- Complex component geometries
- Confined or recessed measurement points
- Heavy castings and forgings
- Small or surface-hardened components
- Production and field hardness testing
Compatibility: Confirm tester compatibility before ordering.